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Nanotechnologie

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Conventional Raman spectroscopy is limited to a spatial resolution on the micron scale. By using novel techniques and materials, information can be gained from structures on a sub-micron or nanometre scale e.g. Raman may be used to classify the diameter of carbon nanotubes, given that the frequency of the radial breathing mode (RBM) is related to the tube diameter.

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TERS and AFM images of SiO2/Si patternPioneering products such as the award winning Nanonics NSOM/AFM 100 Confocal™/Renishaw Raman microscope system have demonstrated superior spatial resolution than is possible with the normal far-field diffraction limit.

The inset image shows the simultaneously collected AFM image and Raman data from a SiO2/Si pattern, collected using the Nanonics NSOM/AFM 100 Confocal™/Renishaw Raman microscope system, depicting a Raman resolution of approximately 250nm. This instrumentation may be also be configured to take advantage of the enhanced spatial resolution offered by Tip Enhanced Raman Spectroscopy (TERS). A TERS probe provides highly localised Raman signal enhancement in an area smaller than the normal far-field diffraction limit, allowing Raman information to be obtained at much greater spatial resolution than with conventional Raman techniques.

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Selected publications


Temperature-mediated growth of single-walled carbon-nanotube intramolecular junctions (2007), Yagang Yao et al, Nature materials, 6, 283-286

Elimination of D-band in Raman spectra of double wall carbon nanotubes by oxidation (2005), S Osswald et al, Chemical Physics letters, 402, 422-427

Near-Field scanning Raman microscopy using apertureless probes (2003), W X Sun et al, Journal of Raman spectroscopy, 34, 668-676

Anomalous two-peak G’ band Raman effect in one isolated single-wall carbon nanotube (2002), A G Souzo Filho et al, Physical Review B, 65, 085417-1 to 085417-7

Étapes suivantes

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